Nikon Software NIS PLUG-IN (z-axis) (65561)

The Nikon Software NIS Plug-in (z-axis) is an extension for the NIS-Elements imaging platform that adds advanced control and automation of Z-axis (focus) movement during microscope imaging. This plug-in is essential for research, laboratory, and industrial environments where capturing three-dimensional data or performing multi-layer imaging is required. With this tool, users can automate the collection of Z-stack images, perform precise Z-positioning, and integrate Z-axis control into complex multi-dimensional experiments, such as time-lapse or multi-channel imaging. The plug-in supports both absolute and relative positioning methods, making it flexible for a variety of imaging workflows.

Enables automated and precise control of the microscope’s Z-axis during image acquisition, allowing users to collect image stacks at different focal depths for 3D reconstruction, extended depth of focus, or quantitative analysis.

Key Functions:

• Automates the acquisition of Z-stack images by defining top and bottom focus positions or by setting a starting plane and imaging symmetrically or asymmetrically around it

• Integrates with the ND Acquisition panel in NIS-Elements for setting up multi-dimensional experiments, including time-lapse and multi-channel imaging

• Supports Z Intensity Correction, which maintains consistent brightness across thick samples by adjusting laser power and gain at different Z positions

• Allows for continuous movement of motorized Z drives, significantly speeding up acquisition by capturing images on the fly

• Displays current Z positions (including coarse and fine drives) in the main status bar for easy monitoring

• Offers user-defined limits for Z movement to prevent hardware collisions or sample damage

• Compatible with advanced features like Extended Depth of Focus (EDF) and 3D modeling by combining Z-series images

Compatibility:
Works with NIS-Elements AR, C, and C-ER packages and supports a wide range of Nikon motorized microscopes and Z-drive systems.

Applications:
3D confocal imaging
Z-stack acquisition for thick or layered samples
Extended depth of focus imaging
Automated multi-dimensional experiments
Quantitative analysis of structures at different depths

Main Features:

• Flexible Z-stack setup with both absolute and relative positioning options

• Integration with other imaging dimensions (time, wavelength, XY position)

• Automated Z Intensity Correction for consistent image quality

• Real-time monitoring and control of Z position

• Enhanced workflow efficiency through automation and device integration

This plug-in is ideal for users who need reliable, automated, and precise Z-axis control in their imaging workflows, ensuring accurate and reproducible results across a variety of advanced microscopy applications.