Nikon Software NIS-Elements D Documentation (68299)

Nikon NIS-Elements D Documentation is a software package designed for efficient photo-documentation and basic image analysis in microscopy. It is widely used in laboratory, industrial, and research environments for capturing, processing, and storing microscope images. The software provides intuitive camera controls, measurement tools, and reporting functions, making it suitable for tasks such as tissue comparison, particle analysis, defect analysis, and material inspection. NIS-Elements D is not intended for clinical diagnostic use, but it offers a flexible workflow for documentation and quantitative analysis in a variety of scientific applications.

Provides a comprehensive platform for photo-documentation, basic measurement, and reporting in microscopy applications.

Key Features:

• Simple camera controls and preset settings for easy image capture

• Flexible imaging options, including automated XY and Z control, as well as timelapse imaging

• Manual and automated measurement tools for length, area, counting, and morphology

• Annotation features for marking and commenting on datasets

• Optional Extended Depth of Focus (EDF) module for creating sharp, high-contrast 2D images from Z-stacks

• Optional High Dynamic Range (HDR) module for combining images with different exposures to capture the full dynamic range of a specimen

• Macro support for custom workflows and automation

• Single document interface for streamlined operation

• Live comparison tools for overlaying and comparing images

• Automated object counting and threshold-based measurements with data export options

• Large image stitching and database modules available for advanced archiving and reporting

• Customizable user interface with support for multiple monitors and flexible panel arrangement

Compatibility:
Works with Nikon microscopes and is compatible with a wide range of imaging devices. Not suitable for fluorescence imaging or wavelength switching.

Applications:

• Documentation and archiving of microscope images

• Particle and defect analysis

• Fiber and textile material analysis

• Tissue comparison and reporting

• Industrial inspection and research imaging

Additional Modules:

• EDF (Extended Depth of Focus): Combines Z-stack images into a single, in-focus image

• HDR (High Dynamic Range): Captures and creates images with enhanced dynamic range

• Automated measurement modules for advanced image processing

• Industrial modules for specialized analysis, such as concrete, filters, and layer thickness

User Interface:

• Customizable layout with dockable panels and toolbars

• Support for multiple monitors and maximized image area

• Status bar displays calibration, image bit depth, size, pixel coordinates, and color mode

• Options to hide or display interface elements for a tailored workspace

NIS-Elements D Documentation is an essential tool for users who need reliable, easy-to-use software for capturing and analyzing microscope images, with options to expand functionality through additional modules as needed.