Nikon P2-CIA QL0.5X Lambda/4 plate (65464)

The Nikon P2-CIA QL0.5X Lambda/4 plate is a quarter-wave plate accessory specifically designed for use with Nikon’s P2-CIA Coaxial Epi Illuminator and compatible stereo microscopes, such as the SMZ25 and SMZ18. This optical plate is used in polarized light microscopy to enhance the contrast and reveal detailed features in birefringent or reflective samples. By introducing a precise phase shift between orthogonal light waves, the plate enables advanced polarization techniques, such as the observation of interference colors and the conversion between linearly and circularly polarized light. This makes it a valuable tool for applications in materials science, geology, electronics, and quality control, where detailed analysis of surface structure and optical properties is required.

This quarter-wave (λ/4) plate is used to introduce a 90-degree phase shift between the ordinary and extraordinary components of polarized light, converting linearly polarized light into circularly or elliptically polarized light, and vice versa.

Compatibility:
Designed for use with the Nikon P2-CIA Coaxial Epi Illuminator, and suitable for stereo microscopes such as the SMZ25 and SMZ18 when using 0.5x or 1x objectives.

Key Features:

• Provides a precise quarter-wavelength (λ/4) retardation, typically at 550 nm (green light), for optimal performance in polarized light applications

• Enhances the ability to observe interference colors and analyze optical path differences in birefringent specimens

• Allows for qualitative and quantitative assessment of optical properties, such as retardation and orientation, in materials

• Can be used to eliminate extinction bands and improve image clarity when analyzing crystals, minerals, polymers, and other anisotropic materials

• Easily inserted at a 45-degree angle to the polarizer and analyzer for correct operation

Applications:
Materials science for analyzing polymers, fibers, and crystalline structures
Geology and mineralogy for mineral identification and birefringence measurement
Electronics and semiconductor inspection for surface structure analysis
Quality control and research requiring advanced polarization techniques

This plate is an essential accessory for anyone performing advanced polarization microscopy, offering precise control over the polarization state of light and enabling accurate, high-contrast imaging of a wide range of birefringent and reflective samples.