Nikon P2-CIA coaxial incident light Illuminator (65462)

The Nikon P2-CIA Coaxial Incident Light Illuminator is an accessory designed for use with Nikon parallel optics-type stereo microscopes, such as the SMZ25 and SMZ18 models. This illuminator provides coaxial episcopic illumination, meaning it directs light through the objective lens along the same path as the observation optics. This setup is especially effective for examining the surface details of opaque or reflective samples, delivering shadow-free, high-contrast images. It is widely used in materials science, electronics, metallurgy, and quality control applications where precise surface inspection is required.

Delivers coaxial episcopic illumination by channeling light through the objective lens directly onto the sample, allowing for clear observation of fine surface features on opaque or reflective specimens.

Compatibility:
Designed for use with Nikon SMZ25 and SMZ18 stereo microscopes and other compatible parallel optics-type models.

Key Features:

• Provides uniform, high-intensity illumination across the field of view

• Enables shadow-free imaging of polished, metallic, or thick samples

• Allows detailed observation of microstructures, defects, and surface characteristics

• Can be combined with other illumination systems, such as fiber optic or ring lights, for versatile imaging

• Often used with a 1/4λ plate for enhanced polarization and contrast

Applications:
Materials science and metallurgy for examining polished sections and metal surfaces
Electronics and semiconductor inspection for detecting microstructures and defects
Quality control and failure analysis in industrial environments
Geology and mineralogy for analyzing opaque minerals and crystals

This illuminator is an essential tool for anyone needing precise, shadow-free imaging of reflective or opaque samples, supporting both routine inspections and advanced research in scientific and industrial settings.